Figure 1From: Atomic Force Microscope nanolithography on chromosomes to generate single-cell genetic probesTopographic AFM micrograph of chromosomes 3 after DNA extraction. Upon localization of the chromosome region to be dissected the AFM microscope is switched in Contact Nanolithography Mode and the probe is scanned at high force (5-10 μN) several time for few lines (up to 8) perpendicularly to the chromatide. The cross sectional analysis of the cut site reveals a full width at half-maximum height of around 50 nm.Back to article page