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Fig. 3 | Journal of Nanobiotechnology

Fig. 3

From: Application of atomic force microscopy in cancer research

Fig. 3

Three basic working modes of AFM. a The curve of both interatomic force and intervals relation. b In contact mode the probe is always slightly contact with the sample and scanned in a constant force mode. c In the non-contact mode the tip of the needle always vibrates on the surface of the sample, but it is never contact with the sample. The scanning detector detects long-range forces such as van der Waals force or electrostatic forces that do not damage the imaged sample. d In the tapping mode the micro cantilever is subjected to stress vibration near its resonant frequency, and the oscillating needle tip gently strikes the surface of the sample, intermittently making contact with it

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