Fig. 3
From: Fabrication of device with poly(N-isopropylacrylamide)-b-ssDNA copolymer brush for resistivity study
a LCSTs, and b thicknesses at 25 and 45 °C of PN8 and PN8D measured for NaCl at concentrations from 0 to 1.0 M. c, d Thicknesses of c PN4, PN8, PN12, PN16 and PN20, and d PN4D, PN8D, PN12D, PN16D and PN20D copolymer brushes at 25 and 45 °C, respectively. e Double-reciprocal plots of 1/A with respect to [PNIPAAm segment] at 25 and 45 °C, according to the linearized formula \(\frac{1}{\Delta A} = \frac{1}{{K_{e} \Delta A_{{\rm max} } [PNIPAAm \,segment ]}} + \frac{1}{{\Delta A_{{\rm max} } }}\). f Ke values of PNIPAAm-b-ssDNA copolymer brushes plotted as a function of NaCl concentration at 25 and 45 °C, respectively