Fig. 4
Characterization of P(NIPAM-co-AA) brush coating. A The XPS curve of blank Silicon wafer, aminated surface Si-NH2, Si-CTA and Si-P(NIPAM-co-AA). B The XPS peak deconvolution and fitting of P(NIPAM-co-AA). C Transmittance spectrum changes of P(NIPAM-co-AA) coating under temperatures from 25 ~ 43 °C. D Transmittance spectrum changes of P(NIPAM-co-AA) coating at 555, 760 and 800 nm under temperatures from 43 to 25 °C. E The water contact angle of blank (25 °C) and P(NIPAM-co-AA) brush surface (4, 25 and 50 °C, respectively). F UV − vis spectra of pristine material (Blank), P(NIPAM-co-AA) brush and IDG@P(NIPAM-co-AA)